Applied Surface Science
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Elsevier BV
- Field
- Energy
- Recent topics
- Force Microscopy Techniques and Applications (14%); ZnO doping and properties (14%); Graphene research and applications (7%); Chalcogenide Semiconductor Thin Films (7%)
- Open access
- Not verified in DOAJ
- Indexed in MEDLINE
- Not verified
- Article processing fee
- $3,930 USD
- ISSN
- 0169-4332
- Last publication year
- 2026
- Country
- Netherlands
This information comes from OpenAlex, and hasn't been independently verified. The journal's own page is the final authority (see the links above).