Microelectronics Reliability
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Elsevier BV
- Field
- Engineering
- Recent topics
- Electronic Packaging and Soldering Technologies (30%); Silicon Carbide Semiconductor Technologies (22%); Integrated Circuits and Semiconductor Failure Analysis (7%); GaN-based semiconductor devices and materials (7%)
- Open access
- Not verified in DOAJ
- Indexed in MEDLINE
- Not verified
- Article processing fee
- $2,280 USD
- ISSN
- 0026-2714
- Last publication year
- 2026
- Country
- United Kingdom
This information comes from OpenAlex, and hasn't been independently verified. The journal's own page is the final authority (see the links above).